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Cyclotron-resonance-assisted photcurrents in surface states of a three-dimensional topological insulator based on a strained high-mobility HgTe film

机译:基于应变高迁移率HgTe膜的三维拓扑绝缘子表面状态中的回旋共振辅助光电流

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摘要

We report on the observation of cyclotron-resonance-induced photocurrents, excited by continuous wave terahertz radiation, in a three-dimensional topological insulator (TI) based on an 80-nm strained HgTe film. The analysis of the photocurrent formation is supported by complementary measurements of magnetotransport and radiation transmission. We demonstrate that the photocurrent is generated in the topologically protected surface states. Studying the resonance response in a gated sample, we examined the behavior of the photocurrent, which enables us to extract the mobility and the cyclotron mass as a function of the Fermi energy. For high gate voltages, we also detected cyclotron resonance (CR) of bulk carriers, with a mass about two times larger than that obtained for the surface states. The origin of the CR-assisted photocurrent is discussed in terms of asymmetric scattering of TI surface carriers in the momentum space. Furthermore, we show that studying the photocurrent in gated samples provides a sensitive method to probe the cyclotron masses and the mobility of two-dimensional Dirac surface states, when the Fermi level lies in the bulk energy gap or even in the conduction band.
机译:我们报告了在基于80 nm应变HgTe薄膜的三维拓扑绝缘体(TI)中由连续波太赫兹辐射激发的回旋共振感应光电流的观察结果。光电流形成的分析得到磁传输和辐射传输的互补测量的支持。我们证明光电流是在拓扑受保护的表面状态下生成的。在门控样品中研究共振响应,我们检查了光电流的行为,这使我们能够提取迁移率和回旋加速器质量作为费米能量的函数。对于高栅极电压,我们还检测到了大体积载流子的回旋共振(CR),其质量比从表面态获得的质量大大约两倍。根据动量空间中TI表面载流子的不对称散射,讨论了CR辅助光电流的起源。此外,我们表明,当费米能级位于整体能隙甚至在导带中时,研究门控样品中的光电流提供了一种灵敏的方法来探测回旋加速器质量和二维狄拉克表面态的迁移率。

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